82 search results - page 4 / 17 » Functional Testing of Microprocessors with Graded Fault Cove... |
CASES
2006
ACM
15 years 1 months ago
2006
ACM
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
ITC
1998
IEEE
15 years 1 months ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
ATS
2003
IEEE
15 years 2 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
105
Voted
ISQED
2002
IEEE
15 years 2 months ago
2002
IEEE
The paper addresses the issue of microprocessor and microcontroller testing, and follows an approach based on the generation of a test program. The proposed method relies on two p...
63
Voted
DFT
2002
IEEE
15 years 2 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...