142 search results - page 10 / 29 » Functional test generation for non-scan sequential circuits |
GLVLSI
2005
IEEE
15 years 3 months ago
2005
IEEE
We develop a neural network that learns to separate the nominal from the faulty instances of a circuit in a measurement space. We demonstrate that the required separation boundari...
VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
The problem of peak power estimation in CMOS circuits is essential for analyzing the reliability and performance of circuits at extreme conditions. The Power Virus problem involves...
TCAD
1998
14 years 9 months ago
1998
—We study the effect of the controller on the testability of sequential circuits composed of controllers and data paths. We show that even when all the loops of the circuit have ...
JAIR
2010
14 years 8 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
DAC
1995
ACM
15 years 1 months ago
1995
ACM
Abstract A new method for power estimation in sequential circuits is presented that is based on a statistical estimation technique. By applying randomly generated input sequences t...