142 search results - page 11 / 29 » Functional test generation for non-scan sequential circuits |
ICCAD
2002
IEEE
15 years 6 months ago
2002
IEEE
In this paper we present an advanced functional extraction tool for automatic generation of high-level RTL from switch-level circuit netlist representation. The tool is called FEV...
MEMOCODE
2007
IEEE
15 years 4 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
ERLANG
2004
ACM
15 years 3 months ago
2004
ACM
Testing of software components during development is a heavily used approach to detect programming errors and to evaluate the quality of software. Systematic approaches to softwar...
GECCO
2003
Springer
15 years 2 months ago
2003
Springer
Evolutionary Testing (ET) has been shown to be very successful for testing real world applications [10]. The original ET approach focusesonsearching for a high coverage of the test...