142 search results - page 12 / 29 » Functional test generation for non-scan sequential circuits |
VLSID
2007
IEEE
15 years 10 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ATS
2005
IEEE
15 years 3 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
ATS
1997
IEEE
15 years 1 months ago
1997
IEEE
Testing circuits which do not include a global reset signal requires either complex ATPG algorithms based on 9- or even 256-valued algebras, or some suitable method to generate in...
ICCAD
1995
IEEE
15 years 1 months ago
1995
IEEE
This paper investigates the effect of the controller on the testability of sequential circuits composed of controllers and data paths. It is shown that even when both the controll...
DFT
2002
IEEE
15 years 2 months ago
2002
IEEE
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...