142 search results - page 14 / 29 » Functional test generation for non-scan sequential circuits |
ICCD
1997
IEEE
15 years 1 months ago
1997
IEEE
This paper presents a new approach to the automated generation of an initialization sequence for synchronous sequential circuits. Finding an initialization sequence is a hard task...
ITC
1997
IEEE
15 years 1 months ago
1997
IEEE
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests for them is becoming a serious problem in industry. This paper...
FPL
2004
Springer
15 years 3 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...
ICCAD
1997
IEEE
15 years 1 months ago
1997
IEEE
Asynchronous circuits operate correctly only under timing assumptions. Hence testing those circuits for delay faults is crucial. This paper describes a three-step method to detect...
ICCD
2005
IEEE
15 years 6 months ago
2005
IEEE
In this paper, we propose a diagnostic test generation method in conjunction with an efficient sequential SAT-based diagnosis procedure to precisely identify multiple defective si...