142 search results - page 16 / 29 » Functional test generation for non-scan sequential circuits |
ICCAD
2009
IEEE
14 years 7 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
ETS
2006
IEEE
15 years 3 months ago
2006
IEEE
— Accurate generation of circuit specifications from test signatures is a difficult problem, since analytical expressions cannot precisely describe the nonlinear relationships ...
DAC
2007
ACM
15 years 10 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
MSE
2003
IEEE
15 years 3 months ago
2003
IEEE
A tool has been developed to automate the testing and grading of design projects implemented in reprogrammable hardware. The server allows multiple students to test circuits in FP...
ICCAD
1994
IEEE
15 years 1 months ago
1994
IEEE
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signi cant area overhead and performance degradation...