142 search results - page 21 / 29 » Functional test generation for non-scan sequential circuits |
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...
VTS
1999
IEEE
15 years 2 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
VLSI
2007
Springer
15 years 3 months ago
2007
Springer
— Software simulation remains the most used method for VHDL RTL functional verification. The functional verification process essentially consists of two parts. The first one is t...
VLSID
2005
IEEE
15 years 3 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
TCAD
2008
14 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...