142 search results - page 3 / 29 » Functional test generation for non-scan sequential circuits |
55
Voted
DATE
2003
IEEE
15 years 3 months ago
2003
IEEE
VLSID
2002
IEEE
15 years 10 months ago
2002
IEEE
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
DATE
1999
IEEE
15 years 2 months ago
1999
IEEE
In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated...
JISE
2000
14 years 9 months ago
2000
We present an algorithm for identifyinga set of faults that do not have to be targeted by a sequential delay fault test generator. These faults either cannot independently aect th...
ATS
2000
IEEE
15 years 2 months ago
2000
IEEE
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...