142 search results - page 4 / 29 » Functional test generation for non-scan sequential circuits |
DATE
1999
IEEE
15 years 2 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
EURODAC
1995
IEEE
15 years 1 months ago
1995
IEEE
We present a procedure to generate short test sequences for synchronous sequential circuits described at the gate level. Short test sequences are important in reducing test applic...
TODAES
1998
14 years 9 months ago
1998
