142 search results - page 6 / 29 » Functional test generation for non-scan sequential circuits |
VLSID
1997
IEEE
15 years 1 months ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
ITC
1994
IEEE
15 years 1 months ago
1994
IEEE
DSD
2005
IEEE
15 years 3 months ago
2005
IEEE
Current paper presents new alternatives for accelerating the task of fault simulation for sequential circuits by hardware emulation on FPGA. Fault simulation is an important subta...
VTS
2000
IEEE
15 years 2 months ago
2000
IEEE
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...