142 search results - page 9 / 29 » Functional test generation for non-scan sequential circuits |
DATE
2007
IEEE
15 years 4 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...
TCAD
1998
14 years 9 months ago
1998
—New methods for fault-effect propagation and state justification that use finite-state-machine sequences are proposed for sequential circuit test generation. Distinguishing se...
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VTS
1996
IEEE
15 years 1 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
DAC
1999
ACM
15 years 2 months ago
1999
ACM
As the sizes of general and special purpose processors increase rapidly, generating high quality manufacturing tests which can be run at native speeds is becoming a serious proble...
TC
2008
14 years 9 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...