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VLSID
2006
IEEE
169views VLSI» more  VLSID 2006»
15 years 5 months ago
A Low Leakage and SNM Free SRAM Cell Design in Deep Sub Micron CMOS Technology
As the IC process technology scales, the oxide thickness and operating voltage continues to decrease. The gate oxide thickness in recent and future IC process technology has appro...
Sanjeev K. Jain, Pankaj Agarwal
ACMSE
2006
ACM
15 years 5 months ago
Security issues in privacy and key management protocols of IEEE 802.16
Without physical boundaries, a wireless network faces many more security threats than a wired network does. Therefore, in the IEEE 802.16 standard a security sublayer is specified...
Sen Xu, Manton M. Matthews, Chin-Tser Huang
ASPLOS
2006
ACM
15 years 5 months ago
Ultra low-cost defect protection for microprocessor pipelines
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
Smitha Shyam, Kypros Constantinides, Sujay Phadke,...
DIM
2006
ACM
15 years 5 months ago
User centricity: a taxonomy and open issues
User centricity is a significant concept in federated identity management (FIM), as it provides for stronger user control and privacy. However, several notions of user-centricity...
Abhilasha Bhargav-Spantzel, Jan Camenisch, Thomas ...
MOBICOM
2006
ACM
15 years 5 months ago
Long-distance 802.11b links: performance measurements and experience
The use of 802.11 long-distance links is a cost-effective means of providing wireless connectivity to rural areas. Although deployments in this setting are increasing, a systemat...
Kameswari Chebrolu, Bhaskaran Raman, Sayandeep Sen