2 search results - page 1 / 1 » GECOM: Test data compression combined with all unknown respo... |
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Voted
ASPDAC
2008
ACM
14 years 12 months ago
2008
ACM
This paper introduces GECOM technology, a novel test compression method with seamless integration of test GE
DAC
2005
ACM
14 years 12 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...