694 search results - page 4 / 139 » Gate Sizing Using a Statistical Delay Model |
PATMOS
2005
Springer
15 years 3 months ago
2005
Springer
The time taken for a CMOS logic gate output to change after one or more inputs have changed is called the output delay of the gate. A conventional multi-input CMOS gate is designed...
ISPD
1999
ACM
15 years 1 months ago
1999
ACM
- In this paper, we present an algorithm for gate sizing with controlled displacement to improve the overall circuit timing. We use a path-based delay model to capture the timing c...
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ICCAD
2003
IEEE
15 years 6 months ago
2003
IEEE
This paper proposes a model for calculating statistical gate-delay variation caused by intra-chip and inter-chip variability. As the variation of individual gate delays directly i...
ISQED
2005
IEEE
15 years 3 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
TCAD
2010
14 years 4 months ago
2010
PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...