4 search results - page 1 / 1 » Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Par... |
104
Voted
DFT
2002
IEEE
15 years 6 months ago
2002
IEEE
We propose an algorithm for gate-delay fault diagnosis. It is based on the inject-and-evaluate paradigm [1], in which the fault site(s) are predicted through a series of injection...
78
Voted
TODAES
2008
15 years 1 months ago
2008
122
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IJCAI
1989
15 years 3 months ago
1989
Is there one logical de nition of diagnosis? In this paper I argue that the answer to this question is \no". This paper is about the pragmatics of using logic for diagnosis w...
96
Voted
ATS
2002
IEEE
15 years 6 months ago
2002
IEEE
This paper addresses the problem of locating the stuckopen faults in a manufactured IC with scan flip-flops. Unlike most previous methods that only aim at identifying the faulty s...