Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
In this paper we propose a novel integrated circuit and architectural level technique to reduce leakage power consumption in high performance cache memories using single Vt (trans...
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
In this paper, we propose a new global router, BoxRouter, powered by the concept of box expansion and progressive integer linear programming (ILP). BoxRouter first uses a simple P...