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DAC
2007
ACM
16 years 26 days ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
DAC
2002
ACM
16 years 25 days ago
DRG-cache: a data retention gated-ground cache for low power
In this paper we propose a novel integrated circuit and architectural level technique to reduce leakage power consumption in high performance cache memories using single Vt (trans...
Amit Agarwal, Hai Li, Kaushik Roy
DAC
2005
ACM
16 years 25 days ago
Advanced Timing Analysis Based on Post-OPC Extraction of Critical Dimensions
While performance specifications are verified before sign-off for a modern nanometer scale design, extensive application of optical proximity correction substantially alters the l...
Puneet Gupta, Andrew B. Kahng, Youngmin Kim, Denni...
DAC
2006
ACM
16 years 25 days ago
BoxRouter: a new global router based on box expansion and progressive ILP
In this paper, we propose a new global router, BoxRouter, powered by the concept of box expansion and progressive integer linear programming (ILP). BoxRouter first uses a simple P...
Minsik Cho, David Z. Pan
ICML
1999
IEEE
16 years 20 days ago
Least-Squares Temporal Difference Learning
Excerpted from: Boyan, Justin. Learning Evaluation Functions for Global Optimization. Ph.D. thesis, Carnegie Mellon University, August 1998. (Available as Technical Report CMU-CS-...
Justin A. Boyan