Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...
Multicore SOCs rely on runtime thermal measurements using on-chip sensors for DTM. In this paper we address the problem of estimating the actual temperature of on-chip thermal sen...
As VLSI technology moves to the 65nm node and beyond, interconnect delay greatly limits the circuit performance. As a critical component in interconnect synthesis, layer assignmen...
Software evolves to fix bugs and add features. Stopping and restarting programs to apply changes is inconvenient and often costly. Dynamic software updating (DSU) addresses this ...
Suriya Subramanian, Michael W. Hicks, Kathryn S. M...
Modern programs frequently employ sophisticated modular designs. As a result, performance problems cannot be identified from costs attributed to routines in isolation; understand...
Nathan R. Tallent, John M. Mellor-Crummey, Michael...