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107
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KBSE
2000
IEEE
15 years 4 months ago
2000
IEEE
Distributed information systems for decision support and e-commerce applications require coordination of multiple autonomous components and their services to accomplish a set of g...
111
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DATE
1999
IEEE
15 years 4 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
CP
1999
Springer
15 years 4 months ago
1999
Springer
Column generation is a state-of-the-art method for optimally solving di cult large-scale optimization problems such as airline crew assignment. We show how to apply column generati...
NDSS
1999
IEEE
15 years 4 months ago
1999
IEEE
We describe an implementation of a distributed algorithm to generate a shared RSA key. At the end of the computation, an RSA modulus N = pq is publicly known. All servers involved...
ICCAD
1998
IEEE
15 years 4 months ago
1998
IEEE
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...