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SACRYPT
1999
Springer
15 years 4 months ago
1999
Springer
In this paper, we introduce a new approach to the generation of binary sequences by applying trace functions to elliptic curves over GF 2m . We call these sequences elliptic curve...
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DATE
1997
IEEE
15 years 4 months ago
1997
IEEE
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
DFT
1997
IEEE
15 years 4 months ago
1997
IEEE
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
SACRYPT
1998
Springer
15 years 4 months ago
1998
Springer
In this paper, we present a simple method for generating random-based signatures when random number generators are either unavailable or of suspected quality (malicious or accident...
ITC
1997
IEEE
15 years 4 months ago
1997
IEEE
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It take...