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104
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ICCD
2006
IEEE
84views Hardware» more  ICCD 2006»
16 years 13 days ago
Highly-Guided X-Filling Method for Effective Low-Capture-Power Scan Test Generation
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Y...
117
Voted
WISTP
2010
Springer
15 years 10 months ago
Security Analysis of Mobile Phones Used as OTP Generators
Abstract. The Norwegian company Encap has developed protocols enabling individuals to use their mobile phones as one-time password (OTP) generators. An initial analysis of the prot...
Håvard Raddum, Lars Hopland Nestås, Kj...
FLOPS
2010
Springer
15 years 10 months ago
Applying Constraint Logic Programming to SQL Test Case Generation
We present a general framework for generating SQL query test cases using Constraint Logic Programming. Given a database schema and a SQL view defined in terms of other views and s...
Rafael Caballero, Yolanda García-Ruiz, Fern...
FLOPS
2010
Springer
15 years 10 months ago
Code Generation via Higher-Order Rewrite Systems
Abstract. We present the meta-theory behind the code generation facilities of Isabelle/HOL. To bridge the gap between the source (higherorder logic with type classes) and the many ...
Florian Haftmann, Tobias Nipkow
119
Voted
STACS
2009
Springer
15 years 10 months ago
Generating Shorter Bases for Hard Random Lattices
We revisit the problem of generating a “hard” random lattice together with a basis of relatively short vectors. This problem has gained in importance lately due to new cryptogr...
Joël Alwen, Chris Peikert