—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
Xiaoqing Wen, Kohei Miyase, Tatsuya Suzuki, Yuta Y...
Abstract. The Norwegian company Encap has developed protocols enabling individuals to use their mobile phones as one-time password (OTP) generators. An initial analysis of the prot...
We present a general framework for generating SQL query test cases using Constraint Logic Programming. Given a database schema and a SQL view defined in terms of other views and s...
Abstract. We present the meta-theory behind the code generation facilities of Isabelle/HOL. To bridge the gap between the source (higherorder logic with type classes) and the many ...
We revisit the problem of generating a “hard” random lattice together with a basis of relatively short vectors. This problem has gained in importance lately due to new cryptogr...