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122
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DATE
2003
IEEE
114views Hardware» more  DATE 2003»
15 years 9 months ago
A New Approach to Test Generation and Test Compaction for Scan Circuits
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...
Irith Pomeranz, Sudhakar M. Reddy
118
Voted
IPPS
2003
IEEE
15 years 9 months ago
A Case Study of Optimistic Computing on the Grid: Parallel Mesh Generation
This paper describes our progress in creating a case study on optimistic computing for the Grid using parallel mesh generation. For the implementation of both methods we will be u...
Nikos Chrisochoides, Andriy Fedorov, Bruce Lowekam...
136
Voted
DAGM
2003
Springer
15 years 8 months ago
A Generative Model Based Approach to Motion Segmentation
We address the question of how to choose between different likelihood functions for motion estimation. To this end, we formulate motion estimation as a problem of Bayesian inferen...
Daniel Cremers, Alan L. Yuille
95
Voted
FATES
2003
Springer
15 years 8 months ago
Property Oriented Test Case Generation
Abstract. In this paper we propose an approach to automatically produce test cases allowing to check the satis ability of a linear property on a given implementation. Linear proper...
Jean-Claude Fernandez, Laurent Mounier, Cyril Pach...
134
Voted
FM
2003
Springer
98views Formal Methods» more  FM 2003»
15 years 8 months ago
Generating Counterexamples for Multi-valued Model-Checking
Counterexamples explain why a desired temporal logic property fails to hold, and as such are considered to be the most useful form of output from model-checkers. Multi-valued model...
Arie Gurfinkel, Marsha Chechik