27827 search results - page 320 / 5566 » Generating |
127
Voted
ICCD
1996
IEEE
15 years 7 months ago
1996
IEEE
In general, automatic layout composition techniques based on pre-designed devices facilitate the production of small IC numbers by prefabricating their basic structures. They also...
128
Voted
DAC
1994
ACM
15 years 7 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
140
click to vote
ITC
1992
IEEE
15 years 7 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...
98
Voted
SIGCOMM
1990
ACM
15 years 7 months ago
1990
ACM
The current generation of protocol architectures, such as TCP/IP or the IS0 suite, seem successful at meeting the demands of todays networks. However, a number of new requirements...
104
Voted
ITP
2010
15 years 7 months ago
2010
Nitpick is a counterexample generator for Isabelle/HOL that builds on Kodkod, a SAT-based first-order relational model finder. Nitpick supports unbounded quantification, (co)ind...