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128
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DAC
2007
ACM
16 years 4 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2003
ACM
16 years 4 months ago
A 1.3GHz fifth generation SPARC64 microprocessor
Hisashige Ando, Yuuji Yoshida, Aiichiro Inoue, Its...
SIGSOFT
2003
ACM
16 years 4 months ago
Consistency techniques for interprocedural test data generation
This paper presents a novel approach for automated test data generation of imperative programs containing integer, boolean and/or float variables. It extends our previous work to ...
Nguyen Tran Sy, Yves Deville
KDD
2006
ACM
139views Data Mining» more  KDD 2006»
16 years 4 months ago
Generating semantic annotations for frequent patterns with context analysis
As a fundamental data mining task, frequent pattern mining has widespread applications in many different domains. Research in frequent pattern mining has so far mostly focused on ...
Qiaozhu Mei, Dong Xin, Hong Cheng, Jiawei Han, Che...
126
Voted
HPCA
2008
IEEE
16 years 4 months ago
Automated microprocessor stressmark generation
Estimating the maximum power and thermal characteristics of a processor is essential for designing its power delivery system, packaging, cooling, and power/thermal management sche...
Ajay M. Joshi, Lieven Eeckhout, Lizy Kurian John, ...