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ITC
1997
IEEE
73views Hardware» more  ITC 1997»
15 years 8 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
117
Voted
VRML
1997
ACM
15 years 8 months ago
Lodestar: An Octree-Based Level of Detail Generator for VRML
Level of detail generation is important for managing geometric complexity of three-dimensional objects and virtual worlds. However, most algorithms that compute levels of detail do...
Dieter Schmalstieg
135
Voted
ITC
1996
IEEE
83views Hardware» more  ITC 1996»
15 years 8 months ago
Test Generation for Global Delay Faults
This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the numbe...
G. M. Luong, D. M. H. Walker
118
Voted
IMA
1997
Springer
105views Cryptology» more  IMA 1997»
15 years 8 months ago
Split Knowledge Generation of RSA Parameters
We show how it is possible for two parties to co-operate in generating the parameters for an RSA encryption system in such a way that neither individually has the ability to decry...
Clifford Cocks
TACAS
1997
Springer
132views Algorithms» more  TACAS 1997»
15 years 8 months ago
Test Generation for Intelligent Networks Using Model Checking
We study the use of model checking techniques for the generation of test sequences. Given a formal model of the system to be tested, one can formulate test purposes. A model checke...
André Engels, Loe M. G. Feijs, Sjouke Mauw