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ISMVL
2010
IEEE
156views Hardware» more  ISMVL 2010»
15 years 9 months ago
Floating-Point Numeric Function Generators Based on Piecewise-Split EVMDDs
This paper proposes a new architecture for memorybased floating-point numeric function generators (NFGs). The design method uses piecewise-split edge-valued multivalued decision ...
Shinobu Nagayama, Tsutomu Sasao, Jon T. Butler
CRYPTO
2001
Springer
97views Cryptology» more  CRYPTO 2001»
15 years 9 months ago
Two-Party Generation of DSA Signatures
d Abstract) Philip MacKenzie and Michael K. Reiter Bell Labs, Lucent Technologies, Murray Hill, NJ, USA We describe a means of sharing the DSA signature function, so that two parti...
Philip D. MacKenzie, Michael K. Reiter
ER
2001
Springer
96views Database» more  ER 2001»
15 years 9 months ago
Process Patterns to Generate E-commerce Systems
: In electronic commerce, two fundamental types of models are business models and process models. While a business model is concerned with value exchanges between actors, a process...
Prasad Jayaweera, Paul Johannesson, Petia Wohed
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 9 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
15 years 9 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy