27827 search results - page 4984 / 5566 » Generating |
160
click to vote
ISPASS
2007
IEEE
16 years 15 days ago
2007
IEEE
Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
160
click to vote
ISPASS
2007
IEEE
16 years 15 days ago
2007
IEEE
In this paper, we introduce PTLsim, a cycle accurate full system x86-64 microprocessor simulator and virtual machine. PTLsim models a modern superscalar out of order x86-64 proces...
166
click to vote
ISVLSI
2007
IEEE
16 years 15 days ago
2007
IEEE
— Y -interconnects for VLSI chips are based on the use of global and semi-global wiring in only 0◦ , 60◦ , and 120◦ . Though X-interconnects are fast replacing the traditio...
169
click to vote
IV
2007
IEEE
16 years 15 days ago
2007
IEEE
Studies show that roughly one-third of searches that are performed on the web require the user to initiate subsequent searches. Bates [1] theorized that with every search the user...
146
click to vote
KBSE
2007
IEEE
16 years 15 days ago
2007
IEEE
Software compatibility testing is an important quality assurance task aimed at ensuring that component-based software systems build and/or execute properly across a broad range of...