564 search results - page 24 / 113 » Generating Test Data for Functions with Pointer Inputs |
VTS
1997
IEEE
15 years 1 months ago
1997
IEEE
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...
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ICSEA
2007
IEEE
15 years 3 months ago
2007
IEEE
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
STACS
2009
Springer
15 years 4 months ago
2009
Springer
Motivated by the quantum algorithm for testing commutativity of black-box groups (Magniez and Nayak, 2007), we study the following problem: Given a black-box finite ring by an add...
SIGSOFT
2004
ACM
15 years 10 months ago
2004
ACM
Five modern static analysis tools (ARCHER, BOON, PolySpace C Verifier, Splint, and UNO) were evaluated using source code examples containing 14 exploitable buffer overflow vulnera...
ATS
2003
IEEE
15 years 2 months ago
2003
IEEE
Domain testing is a well-known software testing technique. Although research tasks have been initiated in domain testing, automatic test data generation based on character string ...