564 search results - page 35 / 113 » Generating Test Data for Functions with Pointer Inputs |
104
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DATE
2003
IEEE
15 years 8 months ago
2003
IEEE
Test pattern decompression techniques are bounded with the algorithm of test pattern ordering and test data flow controlling. Some of the methods could have more sophisticated sor...
117
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TCAD
2002
15 years 2 months ago
2002
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
129
Voted
SIGSOFT
2000
ACM
15 years 7 months ago
2000
ACM
Constraint-based languages can express in a concise way the complex logic of a new generation of interactive services for applications such as banking or stock trading, that must ...
129
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PVLDB
2010
15 years 1 months ago
2010
Violations of functional dependencies (FDs) are common in practice, often arising in the context of data integration or Web data extraction. Resolving these violations is known to...
156
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GECCO
2005
Springer
15 years 8 months ago
2005
Springer
As the paradigm of object orientation becomes more and more important for modern IT development projects, the demand for an automated test case generation to dynamically test obje...