1722 search results - page 30 / 345 » Generating Tests from Counterexamples |
62
Voted
ICCD
2006
IEEE
15 years 6 months ago
2006
IEEE
—X-filling is preferred for low-capture-power scan test generation, since it reduces IR-drop-induced yield loss without the need of any circuit modification. However, the effecti...
83
Voted
DAC
1994
ACM
15 years 1 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
DATE
1997
IEEE
15 years 1 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
EVOW
2009
Springer
15 years 28 days ago
2009
Springer
Abstract. The testing of anomaly detectors is considered from the perspective of a Multi-objective Evolutionary Exploit Generator (EEG). Such a framework provides users of anomaly ...
VTS
1998
IEEE
15 years 1 months ago
1998
IEEE
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...