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AOSD
2009
ACM
16 years 1 months ago
Automated test data generation for aspect-oriented programs
Despite the upsurge of interest in the Aspect-Oriented Programming (AOP) paradigm, there remain few results on test data generation techniques for AOP. Furthermore, there is no wo...
Mark Harman, Fayezin Islam, Tao Xie, Stefan Wapple...
IROS
2006
IEEE
144views Robotics» more  IROS 2006»
16 years 9 days ago
Estimating Probability Distribution with Q-learning for Biped Gait Generation and Optimization
— A new biped gait generation and optimization method is proposed in the frame of Estimation of Distribution Algorithms (EDAs) with Q-learning method. By formulating the biped ga...
Lingyun Hu, Changjiu Zhou, Zengqi Sun
FCCM
2005
IEEE
131views VLSI» more  FCCM 2005»
15 years 12 months ago
Automating the Layout of Reconfigurable Subsystems Using Circuit Generators
When designing systems-on-a-chip (SoCs), a unique opportunity exists to generate custom FPGA architectures that are specific to the application domain in which the device will be ...
Shawn Phillips, Scott Hauck
DATE
2000
IEEE
130views Hardware» more  DATE 2000»
15 years 10 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
ICML
2010
IEEE
15 years 7 months ago
High-Performance Semi-Supervised Learning using Discriminatively Constrained Generative Models
We develop a semi-supervised learning method that constrains the posterior distribution of latent variables under a generative model to satisfy a rich set of feature expectation c...
Gregory Druck, Andrew McCallum