1 This paper presents a solution to the test time minimization problem for core-based systems that contain sequential cores with STUMPS architecture. We assume a hybrid BIST approa...
Gert Jervan, Petru Eles, Zebo Peng, Raimund Ubar, ...
The problem of discriminating between two nite point sets in n-dimensional feature space by a separating plane that utilizes as few of the features as possible, is formulated as a...
Paul S. Bradley, Olvi L. Mangasarian, W. Nick Stre...
We consider the problem of constructing logical topologies over a wavelength-routed optical network with no wavelength changers. We present a general linear formulation which consi...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Abstract— Mobile wireless sensor networks have to be robust against the limitations of the underlying platform. While lightweight form factor makes them an attractive choice for ...
Lun Jiang, Jyh-How Huang, Ankur Kamthe, Tao Liu, I...