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ACMDIS
2000
ACM
15 years 2 months ago
Lingua Francas for Design: Sacred Places and Pattern Languages
A central challenge in interaction design has to do with its diversity. Designers, engineers, managers, marketers, researchers and users all have important contributions to make t...
Thomas Erickson
VTS
1999
IEEE
106views Hardware» more  VTS 1999»
15 years 1 months ago
RT-level TPG Exploiting High-Level Synthesis Information
High-level test pattern generation is today a widely investigated research topic. The present paper proposes a fully automated, simulation-based ATPG system, to address test patte...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
ATS
2009
IEEE
132views Hardware» more  ATS 2009»
15 years 4 months ago
On Improving Diagnostic Test Generation for Scan Chain Failures
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
DSD
2010
IEEE
171views Hardware» more  DSD 2010»
14 years 8 months ago
Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
Jiri Balcarek, Petr Fiser, Jan Schmidt
ITNG
2008
IEEE
15 years 4 months ago
A Minimalist Visual Notation for Design Patterns and Antipatterns
Achieving a quality software system requires UML designers a good understanding of both design patterns and antipatterns. Unfortunately, UML models for real systems tend to be huge...
Demis Ballis, Andrea Baruzzo, Marco Comini