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DDECS
2007
IEEE
127views Hardware» more  DDECS 2007»
15 years 8 months ago
Instance Generation for SAT-based ATPG
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
Daniel Tille, Görschwin Fey, Rolf Drechsler
DATE
1997
IEEE
100views Hardware» more  DATE 1997»
15 years 6 months ago
On the generation of pseudo-deterministic two-patterns test sequence with LFSRs
Many Built-In Self Test pattern generators use Linear Feedback Shift Registers (LFSR) to generate test sequences. In this paper, we address the generation of deterministic pairs o...
Christian Dufaza, Yervant Zorian
DFT
1997
IEEE
108views VLSI» more  DFT 1997»
15 years 6 months ago
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
104
Voted
RT
1997
Springer
15 years 6 months ago
A Geometry Dependent Texture Generation Framework for Simulating Surface Imperfections
: To model surface imperfections and weathering, we proposea two-step texture generation framework in between manual texture synthesis and automatic physical simulation. Although t...
Tien-Tsin Wong, Wai-Yin Ng, Pheng-Ann Heng
91
Voted
ACL
2006
15 years 3 months ago
FAST - An Automatic Generation System for Grammar Tests
This paper introduces a method for the semi-automatic generation of grammar test items by applying Natural Language Processing (NLP) techniques. Based on manually-designed pattern...
Chia-Yin Chen, Hsien-Chin Liou, Jason S. Chang