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WSCG
2003
176views more  WSCG 2003»
15 years 4 months ago
Grid Method Classification of Islamic Geometric Patterns
This paper proposes a rational classification of Islamic Geometric Patterns (IGP) based on the Minimum Number of Grids (MNG) and Lowest Geometric Shape (LGS) used in the construct...
Ahmad Aljamali, Ebad Banissi
152
Voted
DAC
2005
ACM
16 years 3 months ago
StressTest: an automatic approach to test generation via activity monitors
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
Ilya Wagner, Valeria Bertacco, Todd M. Austin
DATE
2000
IEEE
83views Hardware» more  DATE 2000»
15 years 7 months ago
A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects
Delay defects on I/O pads, interconnections of a board, or interconnections among embedded cores can not be tested with the current IEEE 1149.1 boundary scan design. This paper in...
Sungju Park, Taehyung Kim