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IFIP
2001
Springer
15 years 7 months ago
Functional Test Generation using Constraint Logic Programming
— Semi-formal verification based on symbolic simulation offers a good compromise between formal model checking and numerical simulation. The generation of functional test vector...
Zhihong Zeng, Maciej J. Ciesielski, Bruno Rouzeyre
BC
1998
118views more  BC 1998»
15 years 2 months ago
A cross-interval spike train analysis: the correlation between spike generation and temporal integration of doublets
Abstract. A stochastic spike train analysis technique is introduced to reveal the correlation between the firing of the next spike and the temporal integration period of two conse...
David C. Tam
DATE
2000
IEEE
132views Hardware» more  DATE 2000»
15 years 7 months ago
Automatic Test Bench Generation for Validation of RT-Level Descriptions: An Industrial Experience
In current microprocessors and systems, an increasingly high silicon portion is derived through automatic synthesis, with designers working exclusively at the RT-level, and design...
Fulvio Corno, Matteo Sonza Reorda, Giovanni Squill...
ISPD
2006
ACM
103views Hardware» more  ISPD 2006»
15 years 9 months ago
High accurate pattern based precondition method for extremely large power/ground grid analysis
In this paper, we propose more accurate power/ground network circuit model, which consider both via and ground bounce effects to improve the performance estimation accuracy of on-...
Jin Shi, Yici Cai, Sheldon X.-D. Tan, Xianlong Hon...
APLAS
2006
ACM
15 years 9 months ago
Scheme with Classes, Mixins, and Traits
Abstract. The Scheme language report advocates language design as the composition of a small set of orthogonal constructs, instead of a large accumulation of features. In this pape...
Matthew Flatt, Robert Bruce Findler, Matthias Fell...