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VTS
2005
IEEE
96views Hardware» more  VTS 2005»
15 years 8 months ago
Pseudo-Functional Scan-based BIST for Delay Fault
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
ICPR
2002
IEEE
16 years 4 months ago
Web-Based Evaluation and Deployment of Pattern Recognizers
This paper describes a framework for the automatic evaluation and deployment of pattern recognizers. We identify several classes of user and usage patterns of the system, and desc...
Simon M. Lucas
EDCC
2008
Springer
15 years 4 months ago
Refinement Patterns for Fault Tolerant Systems
The paper puts forward the idea of using fault tolerance refinement patterns to assist system developers in disciplined application of software fault tolerance mechanisms in rigor...
Alexei Iliasov, Alexander Romanovsky
FMCO
2009
Springer
128views Formal Methods» more  FMCO 2009»
15 years 24 days ago
Patterns for Refinement Automation
Formal modelling is indispensable for engineering highly dependable systems. However, a wider acceptance of formal methods is hindered by their insufficient usability and scalabili...
Alexei Iliasov, Elena Troubitsyna, Linas Laibinis,...
ECSA
2010
Springer
15 years 3 months ago
Linking Design Decisions to Design Models in Model-Based Software Development
Abstract. Numerous design decisions are made in model-based software development which often are not documented explicitly. Hence, the design knowledge is 'in the designers mi...
Patrick Könemann, Olaf Zimmermann