10700 search results - page 54 / 2140 » Generative Design Patterns |
VTS
1998
IEEE
15 years 2 months ago
1998
IEEE
This paper proposes an ATPG technique that reduces power dissipation during the test of sequential circuits. The proposed approach exploits some redundancy introduced during the t...
VTS
2002
IEEE
15 years 2 months ago
2002
IEEE
In this paper, we present a test pattern generation algorithm aiming at signal integrity faults on long interconnects. This is achieved by considering the effect of inputs and par...
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ICCAD
1991
IEEE
15 years 1 months ago
1991
IEEE
This paper presents an efficient algorithm for the generation of diagnostic test patterns which distinguish between two arbitrary single stuck-at faults. The algorithm is able to ...
TC
2008
14 years 9 months ago
2008
A low-transition test pattern generator, called the low-transition linear feedback shift register (LT-LFSR), is proposed to reduce the average and peak power of a circuit during te...
AAAI
2006
14 years 11 months ago
2006
The generators and the unique closed pattern of an equivalence class of itemsets share a common set of transactions. The generators are the minimal ones among the equivalent items...