10700 search results - page 55 / 2140 » Generative Design Patterns |
ICCAD
1998
IEEE
15 years 2 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
IJON
2000
14 years 9 months ago
2000
Central pattern generators (CPGs) have traditionally been modeled as sets of coupled bistable oscillators [2]. We present a framework for constructing models which avoid the short...
DATE
2000
IEEE
15 years 2 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
ITC
1995
IEEE
15 years 1 months ago
1995
IEEE
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
JGTOOLS
2006
14 years 9 months ago
2006
Poisson Disk sampling patterns are of interest to the graphics community because their blue-noise properties are desirable in sampling patterns for rendering, illumination, and ot...