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CP
1998
Springer
15 years 2 months ago
Generation of Test Patterns for Differential Diagnosis of Digital Circuits
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
Francisco Azevedo, Pedro Barahona
IJBC
2006
130views more  IJBC 2006»
14 years 9 months ago
Automatic Generation of Self-Replicating Patterns in Graph Automata
Graph automata define symbol dynamics on graph structures, which has capability of generating structures in addition to state transition. The rules of the graph automata are unifo...
Kohji Tomita, Haruhisa Kurokawa, Satoshi Murata
SIGMOD
2000
ACM
129views Database» more  SIGMOD 2000»
15 years 2 months ago
Mining Frequent Patterns without Candidate Generation
Mining frequent patterns in transaction databases, time-series databases, and many other kinds of databases has been studied popularly in data mining research. Most of the previous...
Jiawei Han, Jian Pei, Yiwen Yin
DAC
1997
ACM
15 years 1 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
15 years 1 months ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...