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VLSID
2003
IEEE
15 years 10 months ago
2003
IEEE
This paper introduces a Built-In Self Test (BIST) structure referred to as Universal BIST (UBIST). The Test Pattern Generator (TPG) of the proposed UBIST is designed to generate an...
ER
2001
Springer
15 years 2 months ago
2001
Springer
: In electronic commerce, two fundamental types of models are business models and process models. While a business model is concerned with value exchanges between actors, a process...
COMPSAC
2000
IEEE
15 years 2 months ago
2000
IEEE
Components-based development is promising in improving software development productivity and software quality by re-using existing well-tested software components. However, one of...
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IOLTS
2005
IEEE
15 years 3 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
ITC
1992
IEEE
15 years 1 months ago
1992
IEEE
In this paper we report an automatic test pattern generator that can handle designs with one million gates or more on medium size workstations. Run times and success rates, i.e. t...