10700 search results - page 609 / 2140 » Generative Design Patterns |
213
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AUTOID
2005
IEEE
16 years 5 days ago
2005
IEEE
In this paper, we outline a framework for appropriate and proper usage of simulated data for biometric authentication. Currently, there are no formal guidelines concerning the use...
179
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DATE
2003
IEEE
15 years 12 months ago
2003
IEEE
As the technology is shrinking and the working frequency is going into multi gigahertz range, the issues related to interconnect testing are becoming more dominant. Specifically,...
172
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ITC
2000
IEEE
15 years 11 months ago
2000
IEEE
In this paper a new scheme for deterministic and mixed mode scan-based BIST is presented. It relies on a new type of test pattern generator which resembles a programmable Johnson ...
183
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ISCAS
1993
IEEE
15 years 10 months ago
1993
IEEE
: In this study, we propose two types of coupled oscillators networks and investigate their steady states. One network has two-dimensional honeycomb structure. The other network ha...
164
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DFT
2004
IEEE
15 years 10 months ago
2004
IEEE
In this paper we analyze the performance of a mixed built-in-self-test (BiST) for RF IC digital transceivers, where a baseband processor can be used both as a test pattern generat...