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ICCAD
2002
IEEE
116views Hardware» more  ICCAD 2002»
15 years 6 months ago
Conflict driven techniques for improving deterministic test pattern generation
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
Chen Wang, Sudhakar M. Reddy, Irith Pomeranz, Xiji...
MM
2004
ACM
235views Multimedia» more  MM 2004»
15 years 3 months ago
Automatic music video generation based on temporal pattern analysis
Music video (MV) is a short film meant to present a visual representation of a popular music song. In this paper, we present a system that automatically generates MV-like videos f...
Xian-Sheng Hua, Lie Lu, HongJiang Zhang
ACMICEC
2004
ACM
205views ECommerce» more  ACMICEC 2004»
15 years 3 months ago
M-Modeler: a framework implementation for modeling m-commerce applications
At the present time, the use of mobile technology in business, is becoming an opportunity to generate competitive advantages within organization environments. Mobile technology he...
Ana Hilda Morales-Aranda, Oscar Mayora-Ibarra, San...
VLSID
2002
IEEE
115views VLSI» more  VLSID 2002»
15 years 10 months ago
A Partitioning and Storage Based Built-In Test Pattern Generation Method for Scan Circuits
We describe a built-in test pattern generation method for scan circuits. The method is based on partitioning and storage of test sets. Under this method, a precomputed test set is...
Irith Pomeranz, Sudhakar M. Reddy
DELTA
2008
IEEE
15 years 4 months ago
Adaptive Diagnostic Pattern Generation for Scan Chains
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...
Fei Wang, Yu Hu, Xiaowei Li