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CORR
2011
Springer
151views Education» more  CORR 2011»
14 years 4 months ago
A Simulation Experiment on a Built-In Self Test Equipped with Pseudorandom Test Pattern Generator and Multi-Input Shift Register
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
A. Ahmad
DATE
2009
IEEE
94views Hardware» more  DATE 2009»
15 years 4 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
DAC
1997
ACM
15 years 2 months ago
STARBIST: Scan Autocorrelated Random Pattern Generation
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, M...
ISCAS
1995
IEEE
95views Hardware» more  ISCAS 1995»
15 years 1 months ago
A Self-Test Approach Using Accumulators as Test Pattern Generators
: Configurations of adders and registers, which are available in tnany datapaths, can be utilized to generate pattems and to compact test responses. Thispaper unalyzes tlie patiern...
Albrecht P. Stroele
NETGAMES
2005
ACM
15 years 3 months ago
Dissecting server-discovery traffic patterns generated by multiplayer first person shooter games
We study the ‘background traffic’ resulting from tens of thousands of networked first person shooter (FPS) clients searching for servers on which to play. Networked, multiplay...
Sebastian Zander, David Kennedy, Grenville J. Armi...