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VLSID
2009
IEEE
15 years 10 months ago
2009
IEEE
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully ...
ISCAS
1999
IEEE
15 years 1 months ago
1999
IEEE
The main objectives of Built-In Self Test (BIST) are the design of test pattern generator circuits which achieve the highest fault coverage, require the shortest sequence of test ...
SERA
2005
Springer
15 years 3 months ago
2005
Springer
The development of a family of applications in a domain can be greatly eased if patterns in the domain are systematically reused. Systematic use of such a pattern can be achieved ...
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CHB
2010
14 years 4 months ago
2010
Interaction design patterns are a proven way to communicate good design. However, current pattern collections are not sufficiently powerful and generative to be used as a guide fo...
AROBOTS
2008
14 years 9 months ago
2008
Online trajectory generation for robots with multiple degrees of freedom is still a difficult and unsolved problem, in particular for non-steady state locomotion, that is, when th...