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search results - page 72 / 2140
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Generative Design Patterns
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DATE
2003
IEEE
62
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DATE 2003
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RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
15 years 3 months ago
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www.date-conference.com
Marcelino B. Santos, José M. Fernandes, Isa...
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68
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ATS
1998
IEEE
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ATS 1998
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A Test Pattern Generation Algorithm Exploiting Behavioral Information
15 years 2 months ago
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www.cad.polito.it
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
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54
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GLVLSI
1997
IEEE
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VLSI
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GLVLSI 1997
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Analog Circuit Model of Lamprey Unit Pattern Generator
15 years 2 months ago
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www.cecs.uci.edu
Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...
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52
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GLVLSI
1997
IEEE
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VLSI
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GLVLSI 1997
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An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
15 years 2 months ago
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H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...
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66
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VTS
1996
IEEE
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VTS 1996
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A new test pattern generation method for delay fault testing
15 years 1 months ago
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www.lirmm.fr
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...
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