Sciweavers

10700 search results - page 72 / 2140
» Generative Design Patterns
Sort
View
DATE
2003
IEEE
62views Hardware» more  DATE 2003»
15 years 3 months ago
RTL Test Pattern Generation for High Quality Loosely Deterministic BIST
Marcelino B. Santos, José M. Fernandes, Isa...
ATS
1998
IEEE
106views Hardware» more  ATS 1998»
15 years 2 months ago
A Test Pattern Generation Algorithm Exploiting Behavioral Information
This paper aims at broadening the scope of hierarchical ATPG to the behavioral-level The main problem of using behavioral information for ATPG is the mismatch of timing models bet...
Silvia Chiusano, Fulvio Corno, Paolo Prinetto
GLVLSI
1997
IEEE
131views VLSI» more  GLVLSI 1997»
15 years 2 months ago
Analog Circuit Model of Lamprey Unit Pattern Generator
Elizabeth J. Brauer, Ranu Jung, Denise M. Wilson, ...
GLVLSI
1997
IEEE
92views VLSI» more  GLVLSI 1997»
15 years 2 months ago
An Efficient Dynamic Parallel Approach to Automatic Test Pattern Generation
H.-Ch. Dahmen, Uwe Gläser, Heinrich Theodor V...
VTS
1996
IEEE
75views Hardware» more  VTS 1996»
15 years 1 months ago
A new test pattern generation method for delay fault testing
S. Cremoux, Christophe Fagot, Patrick Girard, Chri...