We present an algorithm for computing Minkowski sums among surfaces of revolution and surfaces of linear extrusion, generated by slope-monotone closed curves. The special structur...
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Finding knowledge from vast quantities of data is a difficult task, made simpler by visually representing this information. The Internet can be considered a vast (global) database,...
We present a novel technique CLIP for optimizing both the height and width of CMOS cell layouts in the two-dimensional (2D) style. CLIP is based on integer-linear programming (ILP...
Abstract. Classical state-oriented testing approaches are based on simple machine models such as Labelled Transition Systems (LTSs), in which data is represented by concrete values...