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99
Voted
ICCD
2008
IEEE
15 years 11 months ago
2008
IEEE
— Circuit and processor designs will continue to increase in complexity for the foreseeable future. With these increasing sizes comes the use of wide buses to move large amounts ...
113
Voted
ICCD
2004
IEEE
15 years 11 months ago
2004
IEEE
Leakage current is a key factor in IC power consumption even in the active operating mode. We investigate the simultaneous optimization of gate size and threshold voltage to reduc...
123
Voted
ICCD
2002
IEEE
15 years 11 months ago
2002
IEEE
— In this paper, we present a new interconnect delay model called Fitted Elmore delay (FED). FED is generated by approximating Hspice delay data using a curve fitting technique....
114
click to vote
ICCAD
2008
IEEE
15 years 11 months ago
2008
IEEE
— The emergence of multi-core and many-core processors has introduced new opportunities and challenges to EDA research and development. While the availability of increasing paral...
116
Voted
APSEC
2009
IEEE
15 years 9 months ago
2009
IEEE
Abstract—As software evolves, engineers use regression testing to evaluate its fitness for release. Such testing typically begins with existing test cases, and many techniques h...