1448 search results - page 4 / 290 » Genetic Algorithms for Dynamic Test Data Generation |
KBSE
2003
IEEE
13 years 11 months ago
2003
IEEE
The use of techniques for automating the generation of software test cases is very important as it can reduce the time and cost of this process. The latest methods for automatic g...
JSS
2008
13 years 4 months ago
2008
This report presents a model-driven, stress test methodology aimed at increasing chances of discovering faults related to network traffic in Distributed Real-Time Systems (DRTS). T...
VTS
1996
IEEE
13 years 10 months ago
1996
IEEE
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
DATE
1999
IEEE
13 years 10 months ago
1999
IEEE
Test application time is an important factor in the overall cost of VLSI chip testing. We present a new ATPG approach for generating compact test sequences for sequential circuits...
EOR
2007
13 years 6 months ago
2007
In today’s competitive electronic marketplace, companies try to create long-lasting relations with their online customers. Log files and registration forms generate millions of...