Abstract. We address the problem of joint feature selection in multiple related classification or regression tasks. When doing feature selection with multiple tasks, usually one c...
Paramveer S. Dhillon, Brian Tomasik, Dean P. Foste...
Abstract. With widespread use of microarray technology as a potential diagnostics tool, the comparison of results obtained from the use of different platforms is of interest. When...
Abstract—Security requirements often have implicit assumptions about trust relationships among actors. The more actors trust each other, the less stringent the security requireme...
System-level computer architecture simulations create large volumes of simulation data to explore alternative architectural solutions. Interpreting and drawing conclusions from thi...
Abstract— Double patterning lithography (DPL) is in current production for memory products, and is widely viewed as inevitable for logic products at the 32nm node. DPL decomposes...