1913 search results - page 297 / 383 » Group Input Machine |
121
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VLSID
2002
IEEE
16 years 3 months ago
2002
IEEE
External pins for test are precious hardware resources because this number is strongly restricted. Cores are tested via test access mechanisms (TAMs) such as a test bus architectu...
124
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ISCC
2009
IEEE
15 years 10 months ago
2009
IEEE
Abstract—This paper presents a novel scalable switching architecture for input queued switches with its proper arbitration algorithms. In contrast to traditional switching archit...
128
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ISSTA
2009
ACM
15 years 9 months ago
2009
ACM
Dynamic test generation consists of executing a program while gathering symbolic constraints on inputs from predicates encountered in branch statements, and of using a constraint ...
151
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GECCO
2007
Springer
15 years 9 months ago
2007
Springer
Schulenburg [15] first proposed the idea to model different trader types by supplying different input information sets to a group of homogenous LCS agent. Gershoff [12] investigat...
MICRO
2006
IEEE
15 years 9 months ago
2006
IEEE
Instruction aggregation—the grouping of multiple operations into a single processing unit—is a technique that has recently been used to amplify the bandwidth and capacity of c...